Applications and metrology at nanometer scale. (Record no. 69543)

000 -LEADER
fixed length control field 02053nam a2200469Ii 4500
001 - CONTROL NUMBER
control field on1250021988
005 - DATE AND TIME OF LATEST TRANSACTION
control field 20220711203659.0
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 210507s2021 enk o 000 0 eng d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 9781119818984
-- (electronic bk. : oBook)
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
ISBN 1119818982
-- (electronic bk. : oBook)
029 1# - (OCLC)
OCLC library identifier AU@
System control number 000069150874
082 04 - CLASSIFICATION NUMBER
Call Number 389/.1
100 1# - AUTHOR NAME
Author Dahoo, Pierre Richard,
245 10 - TITLE STATEMENT
Title Applications and metrology at nanometer scale.
300 ## - PHYSICAL DESCRIPTION
Number of Pages 1 online resource.
490 1# - SERIES STATEMENT
Series statement Reliability of Multiphysical Systems Set ;
505 0# - FORMATTED CONTENTS NOTE
Remark 2 Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
700 1# - AUTHOR 2
Author 2 Pougnet, Philippe,
700 1# - AUTHOR 2
Author 2 El Hami, Abdelkhalak,
856 40 - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier https://doi.org/10.1002/9781119818984
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type eBooks
264 #1 -
-- London, UK :
-- ISTE, Ltd. :
-- Hoboken, NJ :
-- Wiley,
-- 2021.
336 ## -
-- text
-- txt
-- rdacontent
337 ## -
-- computer
-- c
-- rdamedia
338 ## -
-- online resource
-- cr
-- rdacarrier
588 0# -
-- Online resource; title from PDF title page (John Wiley, viewed May 7, 2021).
650 #0 - SUBJECT ADDED ENTRY--SUBJECT 1
-- Metrology.
994 ## -
-- 92
-- DG1

No items available.