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Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

By: Dahoo, Pierre Richard [author.].
Contributor(s): Pougnet, Philippe [author.] | El Hami, Abdelkhalak [author.].
Material type: materialTypeLabelBookSeries: Reliability of multiphysical systems set: v. 10.Publisher: London, UK : Hoboken, NJ : ISTE, Ltd. : Wiley, 2021Description: 1 online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781119818984; 1119818982.Other title: Measurement systems, quantum engineering and RBDO method.Subject(s): MetrologyGenre/Form: Electronic books.DDC classification: 389/.1 Online resources: Wiley Online Library
Contents:
Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics
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Measurement Systems Using Polarized Light -- Quantum-scale Interaction -- Quantum Optics and Quantum Computers -- Reliability-based Design Optimization of Structures -- Short Overview of Quantum Mechanics -- References -- Index -- Other titles from iSTE in Mechanical Engineering and Solid Mechanics

Online resource; title from PDF title page (John Wiley, viewed May 7, 2021).

Wiley Frontlist Obook All English 2021

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