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CMOS SRAM CIRCUIT DESIGN AND PARAMETRIC TEST IN NANO-SCALED TECHNOLOGIES

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BookPublisher: CANADA Springer 2008Description: xvi+193p.,22x18Cms.ISBN: 1402083624.DDC classification: 621.38175 P338

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Item type	Current location	Call number	Status	Date due	Barcode
Books	CENTRAL LIBRARY	621.38175 P338 (Browse shelf)	Available		083830

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