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Test Generation of Crosstalk Delay Faults in VLSI Circuits [electronic resource] / by S. Jayanthy, M.C. Bhuvaneswari.

By: Jayanthy, S [author.].
Contributor(s): Bhuvaneswari, M.C [author.] | SpringerLink (Online service).
Material type: materialTypeLabelBookPublisher: Singapore : Springer Nature Singapore : Imprint: Springer, 2019Edition: 1st ed. 2019.Description: XI, 156 p. 49 illus., 7 illus. in color. online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9789811324932.Subject(s): Electronic circuits | Microprogramming  | Computers | Logic design | Electronic Circuits and Systems | Control Structures and Microprogramming | Hardware Performance and Reliability | Logic DesignAdditional physical formats: Printed edition:: No title; Printed edition:: No title; Printed edition:: No titleDDC classification: 621.3815 Online resources: Click here to access online
Contents:
Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits.
In: Springer Nature eBookSummary: This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.
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Chapter 1. Background and Review of Crosstalk Delay Fault Models and the Crosstalk Effects -- Chapter 2. Review of Test Generation Techniques for Crosstalk Delay Faults -- Chapter 3. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Modified PODEM and FAN Algorithm -- Chapter 4. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults using Single-Objective Genetic Algorithm -- Chapter 5. An Automatic Test Pattern Generation Method for Crosstalk Delay Faults Using Single-Objective Particle Swarm Optimization -- Chapter 6. Simulation of Asynchronous Sequential Circuits using Fuzzy Delay Model -- Chapter 7. Simulation Based Test Generation for Crosstalk Delay Faults in Asynchronous Sequential Circuits.

This book describes a variety of test generation algorithms for testing crosstalk delay faults in VLSI circuits. It introduces readers to the various crosstalk effects and describes both deterministic and simulation-based methods for testing crosstalk delay faults. The book begins with a focus on currently available crosstalk delay models, test generation algorithms for delay faults and crosstalk delay faults, before moving on to deterministic algorithms and simulation-based algorithms used to test crosstalk delay faults. Given its depth of coverage, the book will be of interest to design engineers and researchers in the field of VLSI Testing.

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