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Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties [electronic resource] / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.

by Dahoo, Pierre Richard | Pougnet, Philippe | El Hami, Abdelkhalak.

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: London : Hoboken : ISTE Ltd. ; Wiley 2021Online access: Wiley Online Library Availability: No items available

Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami

by Dahoo, Pierre Richard [author.] | Pougnet, Philippe [author.] | El Hami, Abdelkhalak [author.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: London, UK : Hoboken, NJ : ISTE, Ltd. : Wiley, 2021Other title: Measurement systems, quantum engineering and RBDO method.Online access: Wiley Online Library Availability: No items available