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Analysis of pile foundations subject to static and dynamic loading.
by Kaynia, A. M. (Amir M.). Material type:  Book; Format:
available online
 ; Literary form:
Not fiction
Publisher: [S.l.] : CRC Press, 2022Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available
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Nanotoxicology toxicity evaluation of nanomedicine applications / edited by Hemant Kumar Daima, Shanker Lal Kothari, Bhargava Suresh Kumar.
by Daima, Hemant Kumar [editor.] | Kothari, Shanker Lal [editor.] | Suresh Kumar, Bhargava [editor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
; Audience:
Specialized;
Publisher: Boca Raton : CRC Press, 2021Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available
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Recent advancements in software reliability assurance / edited by Adarsh Anand, Mangey Ram.
by Anand, Adarsh [author.] | Ram, Mangey [author.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, 2019Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available
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Introduction to product design and development for engineers / by Dr. Ali Jamnia.
by Dr. Ali Jamnia [author.] | Taylor and Francis. Edition: First edition.Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available
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Industrial approaches in vibration-based condition monitoring / Jyoti Sinha.
by Sinha, Jyoti Kumar [author.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton : CRC Press, 2020Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available
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Advanced textile testing techniques / [edited by] Sheraz Ahmad, Abher Rasheed, Ali Afzal and Faheem Ahmad.
by Afzal, Ali (Materials scientist) [editor.] | Ahmad, Faheem [editor.] | Ahmad, Sheraz [editor.] | Rasheed, Abher [editor.]. Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton : Taylor & Francis, CRC Press, 2017Online access: Click here to view. Availability: No items available
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Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.
by Chrzanowska-Jeske, Malgorzata [editor.] | Weide-Zaage, Kirsten [editor.]. Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Online access: Click here to view. Availability: No items available
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Food packaging materials : testing & quality assurance / edited by Preeti Singh, Ali Abas Wani, Horst-Christian Langowski.
by Singh, Preeti (Materials scientist) [editor.] | Wani, Ali Abas [editor.] | Langowski, Horst-Christian [editor.]. Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton : CRC Press, [2017]Online access: Click here to view. Availability: No items available
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Handbook of Visual Optics, Volume Two : Instrumentation and Vision Correction.
by Artal, Pablo [editor.]. Edition: First edition.Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, 2017Online access: Taylor & Francis Click here to view. | OCLC metadata license agreement Availability: No items available
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Thermal-aware testing of digital vlsi circuits and systems / by Santanu Chattopadhyay.
by Chattopadhyay, Santanu [author.] | Taylor and Francis. Edition: First edition.Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available
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Condition monitoring and faults diagnosis of induction motors : electrical signature analysis / by Nordin Saad, Muhammad Irfan and Rosdiazli Ibrahim.
by Saad, Nordin [author.] | Irfan, Muhammad [author.] | Ibrahim, Rosdiazli [author.] | Taylor and Francis. Edition: First edition.Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available
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Inelasticity of materials [electronic resource] : an engineering approach and a practical guide / Arun R. Srinivasa, Sivakumar M. Srinivasan.
by Srinivasa, Arun R. (Arun Ramaswamy) | Sivakumar, Srinivasan M. Material type:  Computer file; Format:
electronic
available online
Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2009Online access: Access to full text is restricted to subscribers. Availability: No items available
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Compressibility of ultra-soft soil [electronic resource] / Myint Win Bo.
by Bo, Myint Win, 1954-. Material type: Computer file; Format:
electronic
available online
Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2008Online access: Access to full text is restricted to subscribers. Availability: No items available
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Logic testing and design for testability / Hideo Fujiwara.
by Fujiwara, Hideo [author.] | IEEE Xplore (Online Service) [distributor.] | MIT Press [publisher.]. Material type: Book; Format:
available online
Publisher: Cambridge, Massachusetts : MIT Press, c1985Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1985]Online access: Abstract with links to resource Availability: No items available
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Automated defect prevention : best practices in software management / Dorota Huizinga, Adam Kolawa.
by Huizinga, Dorota [author.] | Kolawa, Adam | IEEE Xplore (Online Service) [distributor.] | Wiley InterScience (Online service) [publisher.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken, New Jersey : Wiley-Interscience : c2007Online access: Abstract with links to resource Availability: No items available
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Software testing : testing across the entire software development life cycle / Gerald D. Everett, Raymond McLeod, Jr.
by Everett, Gerald D, 1943- [author.] | McLeod, Raymond | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: [Piscataway, New Jersey] : IEEE Press, c2007Online access: Abstract with links to resource Availability: No items available
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Semiconductor material and device characterization / Dieter K. Schroder.
by Schroder, Dieter K [author.] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Edition: 3rd ed.Material type: Book; Format:
available online
Publisher: [Piscataway, New Jersey] : IEEE Press, c2006Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2006]Online access: Abstract with links to resource Availability: No items available
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Integrated circuit manufacturability : the art of process and design integration / edited by Jos�e Pineda de Gyvez, Dhiraj Pradhan.
by Pradhan, Dhiraj K | Pineda de Gyvez, Jos�e | John Wiley & Sons [publisher.] | IEEE Circuits and Systems Society | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Piscataway, New Jersey : IEEE Press, c1999Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available
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Digital systems testing and testable design / Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
by Abramovici, Miron [author.] | Breuer, Melvin A | Friedman, Arthur D | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: New York, NY : Computer Science Press, c1990Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1994]Online access: Abstract with links to resource Availability: No items available
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Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.
by Chan, H. Anthony, 1952- | Englert, Paul J, 1960- | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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