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Handbook of RAMS in railway systems / edited by Qamar Mahboob, Enrico Zio.
by Mahboob, Qamar [editor.] | Zio, Enrico [editor.]. Material type:  Book; Literary form:
Not fiction
Publisher: Boca Raton : Taylor & Francis, CRC Press, 2018Other title: Handbook of reliability, availability, maintainability, and safety in railway systems.Online access: Click here to view. Availability: No items available
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System Reliability Management : Solutions and Technologies / edited by Adarsh Anand and Mangey Ram.
by Anand, Adarsh [editor.] | Ram, Mangey [editor.] | Taylor and Francis. Edition: First edition.Material type: Book; Format:
available online
 ; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, 2018Online access: Click here to view. Availability: No items available
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Fluctuation mechanism and control on system instantaneous availability / Yi Yang, Yong-Li Yu, Li-Chao Wang.
by Yang, Yi (Engineer) [author.] | Yu, Yong-Li [author.] | Wang, Li-Chao [author.]. Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton : Taylor & Francis, [2016]Copyright date: ©2016Online access: Click here to view. Availability: No items available
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Secure and resilient software development / Mark S. Merkow, Lakshmikanth Raghavan.
by Merkow, Mark S [author.] | Raghavan, Lakshmikanth. Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton, Fla. : CRC Press, 2010Online access: Click here to view. Availability: No items available
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Computer system reliability : safety and usability / B.S. Dhillon.
by Dhillon, B. S [author.]. Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton : Taylor & Francis, 2013Online access: Click here to view. Availability: No items available
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Recent advancements in software reliability assurance / edited by Adarsh Anand, Mangey Ram.
by Anand, Adarsh [author.] | Ram, Mangey [author.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, 2019Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available
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Advanced mathematical techniques in engineering sciences / edited by Mangey Ram and J. Paulo Davim.
by Davim, J. Paulo [editor.] | Ram, Mangey [editor.] | Taylor and Francis. Edition: First edition.Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, an imprint of Taylor and Francis, 2018Online access: Click here to view. Availability: No items available
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Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.
by Chrzanowska-Jeske, Malgorzata [editor.] | Weide-Zaage, Kirsten [editor.]. Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Online access: Click here to view. Availability: No items available
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Reliability Engineering : Theory and Applications / edited by Ilia Vonta and Mangey Ram.
by Vonta, Ilia [editor.] | Ram, Mangey [editor.] | Taylor and Francis. Edition: First edition.Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, [2018]Copyright date: ©2019Online access: Click here to view. Availability: No items available
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Basics of reliability and risk analysis [electronic resource] : worked out problems and solutions / Enrico Zio, Piero Baraldi, Francesco Cadini.
by Zio, Enrico | Baraldi, Piero | Cadini, Francesco. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Singapore : World Scientific Publishing, [2019], c2011Online access: Access to full text is restricted to subscribers. Availability: No items available
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Computational methods for reliability and risk analysis [electronic resource] / Enrico Zio.
by Zio, Enrico. Material type:  Computer file; Format:
electronic
available online
Publisher: Singapore : World Scientific Publishing Co. Pte Ltd., ©2009Online access: Access to full text is restricted to subscribers. Availability: No items available
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Power-system reliability calculations / [by] Roy Billinton, Robert J. Ringlee, and Allen J. Wood.
by Billinton, Roy [author.] | Ringlee, Robert J [joint author.] | Wood, Allen J [joint author.] | IEEE Xplore (Online Service) [distributor.] | MIT Press [publisher.]. Material type: Book; Format:
available online
Publisher: Cambridge, Massachusetts : MIT Press, [1973]Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2003]Online access: Abstract with links to resource Availability: No items available
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Maintaining mission critical systems in a 24/7 environment / Peter M. Curtis.
by Curtis, Peter M [author.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken, New Jersey : Wiley, c 2007Online access: Abstract with links to resource Availability: No items available
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Risk assessment of power systems : models, methods, and applications / Wenyuan Li.
by Li, Wenyuan [author.] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
Publisher: Piscataway, New Jersey : IEEE Press, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005]Online access: Abstract with links to resource Availability: No items available
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Digital communication over fading channels / Marvin K. Simon, Mohamed-Slim Alouini.
by Simon, Marvin Kenneth, 1939- | Alouini, Mohamed-Slim | IEEE Xplore (Online Service) [distributor.] | John Wiley & Sons [publisher.]. Edition: 2nd ed.Material type: Book; Format:
available online
Publisher: Hoboken, New Jersey : John Wiley & Sons, c2005Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2005]Online access: Abstract with links to resource Availability: No items available
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Modeling for reliability analysis : Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems / Jan Pukite, Paul Pukite.
by Pukite, Jan, 1928- | Pukite, Paul | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: New York : IEEE Press, c1998Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [1998]Online access: Abstract with links to resource Availability: No items available
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Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.
by Chan, H. Anthony, 1952- | Englert, Paul J, 1960- | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Power distribution system reliability : practical methods and applications / Ali A. Chowdhury, Don O. Koval.
by Chowdhury, Ali A [author.] | Koval, D. O. (Don Orest) | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken [New Jersey] : John Wiley & Sons, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Practical system reliability / Eric Bauer, Xuemei Zhang, Douglas A. Kimber.
by Bauer, Eric [author.] | Zhang, Xuemei [aut ] | Kimber, Douglas A [aut ] | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Piscataway, New Jersey : IEEE Press, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available
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Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].
by Strong, Alvin Wayne, 1946- | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Piscataway, New Jersey : IEEE Press, c2009Online access: Abstract with links to resource Availability: No items available
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