Capacitance Spectroscopy of Semiconductors / editors, Ferrari, Giorgio.
By: Lee, Jian V [editor.]
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Contributor(s): Ferrari, Giorgio [editor.].
Material type: 
BookPublisher: Boca Raton, FL : CRC Press, 2018Edition: First edition.Description: 1 online resource : text file, PDF.Content type: text Media type: computer Carrier type: online resourceISBN: 9781315150130; 1315150131; 9781351368452; 1351368451.Subject(s): Spectrum analysis | SemiconductorsDDC classification: 535.84 Online resources: Taylor & Francis | Taylor & Francis | OCLC metadata license agreement Scope and content: "Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, in academia, national institutions, and industry, subdivided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. In the Physics section, we establish the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. In the Instrumentation section, we review the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. In the Applications section, we detail the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. In the Emerging Techniques section, we present the latest advances of capacitance-based electrical characterization aimed at reaching nanometer-scale resolution. This book is the first dedicated treatment of the subject of capacitance spectroscopy of semiconductors. This book caters to an audience with a wide background in materials science, electrical engineering, chemistry, and physics in various career stages from advanced undergraduate- and graduate-level students to professional researchers."--Provided by publisher.
"Capacitance spectroscopy refers to techniques for characterizing the electrical properties of semiconductor materials, junctions, and interfaces, all from the dependence of device capacitance on frequency, time, temperature, and electric potential. This book includes 15 chapters written by world-recognized, leading experts in the field, in academia, national institutions, and industry, subdivided into four sections: Physics, Instrumentation, Applications, and Emerging Techniques. In the Physics section, we establish the fundamental framework relating capacitance and its allied concepts of conductance, admittance, and impedance to the electrical and optical properties of semiconductors. In the Instrumentation section, we review the electronic principles of capacitance measurements used by commercial products, as well as custom apparatus. In the Applications section, we detail the implementation in various scientific fields and industries, such as photovoltaics and electronic and optoelectronic devices. In the Emerging Techniques section, we present the latest advances of capacitance-based electrical characterization aimed at reaching nanometer-scale resolution. This book is the first dedicated treatment of the subject of capacitance spectroscopy of semiconductors. This book caters to an audience with a wide background in materials science, electrical engineering, chemistry, and physics in various career stages from advanced undergraduate- and graduate-level students to professional researchers."--Provided by publisher.
OCLC-licensed vendor bibliographic record.
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