Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.
Contributor(s): Chrzanowska-Jeske, Malgorzata [editor.]
| Weide-Zaage, Kirsten [editor.].
Material type: 
BookSeries: Devices, circuits, and systems: Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Description: 1 online resource.Content type: text Media type: computer Carrier type: online resourceISBN: 9781315368948; 9781315332901.Subject(s): Semiconductors -- Reliability | Extreme environments | Environmental testingAdditional physical formats: Print version: : No titleDDC classification: 621.38152 Online resources: Click here to view.
Contents:
section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design.
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section I. Radiation -- section II. Sensors and operating conditions -- section III. Packaging and system design.
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