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Particle control for semiconductor manufacturing / edited by R.P. Donovan.

by Donovan [author.] | Donovan, R. P [editor.].

Edition: 1stMaterial type: book Book; Format: available online remote; Literary form: Not fiction Publisher: London : Routledge, 2018Online access: Taylor & Francis | OCLC metadata license agreement Availability: No items available

Dopants and defects in semiconductors / Matthew D. McCluskey, Washington State University, Pullman, Washington, USA, Eugene E. Haller, UC Berkeley and Lawrence Berkeley National Laboratory, Berkeley, California, USA.

by McCluskey, Matthew D [author.] | Haller, Eugene E [author.].

Edition: Second edition.Material type: book Book; Literary form: Not fiction Publisher: Boca Raton, Fla. : CRC Press, Taylor & Francis Group, [2018]Copyright date: ©2018Online access: Click here to view. Availability: No items available

Extended defects in semiconductors : electronic properties, device effects and structures / D.B. Holt, B.G. Yacobi.

by Holt, D. B [author.] | Yacobi, B. G [author.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Cambridge : Cambridge University Press, 2007Online access: Click here to access online Availability: No items available