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Extreme environment electronics / edited by John D. Cressler, H. Alan Mantooth.

by Cressler, John D | Mantooth, H. Alan, 1963-.

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, 2013Online access: Click here to view. Availability: No items available

Semiconductor devices in harsh conditions / edited by Kirsten Weide-Zaage, Malgorzata Chrzanowska-Jeske ; managing editor, Krzysztof Iniewski.

by Chrzanowska-Jeske, Malgorzata [editor.] | Weide-Zaage, Kirsten [editor.].

Material type: book Book; Literary form: Not fiction Publisher: Boca Raton : CRC Press, [2017]Copyright date: ©2017Online access: Click here to view. Availability: No items available

Accelerated stress testing handbook : guide for achieving quality products / edited by H. Anthony Chan, Paul J. Englert.

by Chan, H. Anthony, 1952- | Englert, Paul J, 1960- | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: New York : IEEE Press, c2001Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2009]Online access: Abstract with links to resource Availability: No items available