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Reliability wearout mechanisms in advanced CMOS technologies / Alvin W. Strong ... [et al.].

by Strong, Alvin Wayne, 1946- | IEEE Xplore (Online Service) [distributor.] | Wiley [publisher.].

Material type: book Book; Format: available online remote; Literary form: Not fiction Publisher: Piscataway, New Jersey : IEEE Press, c2009Online access: Abstract with links to resource Availability: No items available

Transient-induced latchup in CMOS integrated circuits / Ming-Dou Ker and Sheng-Fu Hsu.

by Ker, Ming-Dou [author.] | Hsu, Sheng-Fu | John Wiley & Sons [publisher.] | IEEE Xplore (Online service) [distributor.].

Material type: book Book; Format: available online remote Publisher: Singapore ; Wiley, c2009Distributor: [Piscataqay, New Jersey] : IEEE Xplore, [2010]Online access: Abstract with links to resource Availability: No items available