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Metrology and standardization of nanotechnology : protocols and industrial innovations / edited by Elisabeth Mansfield, Debra L. Kaiser, Daisuke Fujita, and Marcel Van de Voorde.
by Mansfield, Elisabeth [editor.] | Kaiser, Debra L [editor.] | Fujita, Daisuke [editor.] | Voorde, M. H. van de (Marcel H.) [editor.]. Material type:  Book; Format:
available online
 ; Literary form:
Not fiction
Publisher: Weinheim, Germany : Wiley-VCH, 2017Online access: Wiley Online Library Availability: No items available
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Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties [electronic resource] / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami.
by Dahoo, Pierre Richard | Pougnet, Philippe | El Hami, Abdelkhalak. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: London : Hoboken : ISTE Ltd. ; Wiley 2021Online access: Wiley Online Library Availability: No items available
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Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method / Pierre Richard Dahoo, Philippe Pougnet, Abdelkhalak El Hami
by Dahoo, Pierre Richard [author.] | Pougnet, Philippe [author.] | El Hami, Abdelkhalak [author.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: London, UK : Hoboken, NJ : ISTE, Ltd. : Wiley, 2021Other title: Measurement systems, quantum engineering and RBDO method.Online access: Wiley Online Library Availability: No items available
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Metrology and instrumentation : practical applications for engineering and manufacturing / Samir Mekid.
by Mekid, Samir [author.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
Publisher: Hoboken, NJ : Wiley, 2021Online access: Wiley Online Library Availability: No items available
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Introduction to optical metrology / by Rajpal S. Sirohi.
by Sirohi, Rajpal S [author.] | CRC Press. Edition: First edition.Material type: Book; Literary form:
Not fiction
Publisher: Boca Raton, FL : CRC Press, 2015Online access: Click here to view. Availability: No items available
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Advancement of Optical Methods & Digital Image Correlation in Experimental Mechanics [electronic resource] : Proceedings of the 2020 Annual Conference on Experimental and Applied Mechanics / edited by Ming-Tzer Lin, Cosme Furlong, Chi-Hung Hwang.
by Lin, Ming-Tzer [editor.] | Furlong, Cosme [editor.] | Hwang, Chi-Hung [editor.] | SpringerLink (Online service). Edition: 1st ed. 2021.Source: Springer Nature eBookMaterial type: Book; Format:
electronic
available online
; Literary form:
Not fiction
Publisher: Cham : Springer International Publishing : Imprint: Springer, 2021Online access: Click here to access online Availability: No items available
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Full field optical metrology and applications / Fernando Mendoza-Santoyo, Manuel De la Torre-Ibarra, Mar�ia del Socorro Hern�andez-Montes and Jorge Mauricio Flores Moreno.
by Mendoza-Santoyo Fernando [author.] | Torre-Ibarra, Manuel de la [author.] | Hern�andez-Montes, Mar�ia del Socorro [author.] | Flores Moreno, Jorge Mauricio [author.] | Institute of Physics (Great Britain) [publisher.]. Material type: Book; Format:
available online
; Literary form:
Not fiction
; Audience:
Specialized;
Publisher: Bristol [England] (Temple Circus, Temple Way, Bristol BS1 6HG, UK) : IOP Publishing, [2022]Online access: Click here to access online Availability: No items available
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